OUTDOOR DEGRADATION ANALYSES OF SIX DIFFERENT AGED PHOTOVOLTAIC MODULE TECHNOLOGIES UNDER THE ARID-STEPPE CLIMATE CONDITION
Erişim
info:eu-repo/semantics/openAccessTarih
2024Erişim
info:eu-repo/semantics/openAccessÜst veri
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Scopus EXPORT DATE: 01 November 2024 @ARTICLE{Cantürk2024103, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85205295584&doi=10.47480%2fisibted.1494143&partnerID=40&md5=e70916277b1ceca0e6bfb11b3e25d0c4}, affiliations = {Department of Physics, Middle East Technical University, Ankara, 06800, Turkey; ODTU-GÜNAM, Middle East Technical University, Ankara, 06800, Turkey; Department of Electrical and Electronics Engineering, Gumuşhane University, Gumuşhane, 29100, Turkey; Earth System Science Program, Middle East Technical University, Ankara, 06531, Turkey}, publisher = {Turk Isi Bilimi ve Teknigi Dernegi}, issn = {13003615}, language = {English}, abbrev_source_title = {Isi. Bilimi Tek. Derg. J. Therm. Sci. Technol.} }Özet
Outdoor tests of photovoltaics module are crucial both for marketing and for research and technological developments. The electric generation performance and their degradation rates and lifetime are also related to different climatic conditions of the regions. In this work, the outdoor tests are carried out for six different photovoltaic (PV) modules under Arid-steppe Climate condition of Ankara, Türkiye. Their degradation rates are calculated by using linear regression (LR) and year on year (YOY) methods. The comparison between LR and YOY are carried out and with the other performed studies of different regions of world. In addition, it is investigated that how effective the climatic conditions on daily degradation rates. The results obtained are as follows: Mono-Si and Hetero-junction Silicon (HIT) cell modules degradation rates of 0.71/1.56 %/year and 0.84 %/year are respectively obtained by LR method and 0.57/0.90 %/year and 0.85%/year are respectively by YOY method. The degradation rates for Cupper Indium Selenide (CIS), Cupper Indium Gallium Selenide (CIGS) and microcrystalline Silicon/Amorphous Silicon (µc-Si/a-Si) modules have 1.73/1.49 %/year, 11.55/9.52 %/year and 1.48 %/year for LR method and 1.28/1.12 %/year, 9.94/9.53 %/year and 0.99 %/year for YOY method are obtained respectively. It is also obtained for the Polycrystalline Silicon Modules as 1.20/1.86 %/year degradation rates by LR method and 0.79/1.88 %/year degradation rates by YOY method. © 2024 TIBTD Printed in Turkey.
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https://www.scopus.com/record/display.uri?eid=2-s2.0-85205295584&origin=SingleRecordEmailAlert&dgcid=raven_sc_affil_en_us_email&txGid=fca3a05b20c732264ad7b2780f2520edhttps://hdl.handle.net/20.500.12440/6344