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dc.contributor.authorDogan, Hulya
dc.contributor.authorDogan, Ramazan Ozgur
dc.date.accessioned2023-10-13T11:57:45Z
dc.date.available2023-10-13T11:57:45Z
dc.date.issued2023en_US
dc.identifier.citationH. Doğan and R. Ö. Doğan, "Deep Learning Based Focus Measurement Operator for 3D Imaging in Microscopic Systems," 2023 31st Signal Processing and Communications Applications Conference (SIU), Istanbul, Turkiye, 2023, pp. 1-4, doi: 10.1109/SIU59756.2023.10224024.en_US
dc.identifier.urihttps://ieeexplore.ieee.org/document/10224024
dc.identifier.urihttps://hdl.handle.net/20.500.12440/6059
dc.description.abstractSince 3D imaging in microscopic systems makes cell and tissue structures more prominent and visible, it provides higher performance in image processing applications such as automatic segmentation, recognition, classification, alignment and stitching. For this reason, 3D imaging in microscopic systems has been one of the most comprehensive and long-studied research areas in the literature. It seems that the most frequently preferred strategy for 3D imaging is shape from focus. Shape from focus is a strategy that uses a sequence of 2D images with the same perspective and different focused regions to create the 3D shape of the sample. Focus measurement operators are applied to extract the focus properties of the input images in shape from focus strategies. These operators have several limitations, such as more precise characterization of curves and edges in images. Researchers often use a pre- or post-processing technique to minimize these limitations, rather than proposing a new focus measurement operator. In this study, a deep learning based focus measurement operator, which does not require a pre- or post-processing technique, is developed to eliminate these limitations. The qualitative and quantitative results obtained in the study show that the proposed focus measurement operator is more effective in 3D imaging than other operators in the literature.en_US
dc.language.isoturen_US
dc.publisherIEEEen_US
dc.relation.ispartof2023 31. SİNYAL İŞLEME VE İLETİŞİM UYGULAMALARI KONFERANSI, SIUen_US
dc.rightsinfo:eu-repo/semantics/restrictedAccessen_US
dc.subject3D imagingen_US
dc.subjectshape from focusen_US
dc.subjectdeep learningen_US
dc.subjectunsupervised learningen_US
dc.subjectfocus measurement operatoren_US
dc.titleDeep Learning Based Focus Measurement Operator for 3D Imaging in Microscopic Systemsen_US
dc.typeconferenceObjecten_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.description.wospublicationidWOS:001062571000232en_US
dc.departmentFakülteler, Mühendislik ve Doğa Bilimleri Fakültesi, Yazılım Mühendisliği Bölümüen_US
dc.authorid0000-0001-6415-5755en_US
dc.contributor.institutionauthorDogan, Ramazan Ozgur
dc.identifier.doi10.1109/SIU59756.2023.10224024en_US
dc.authorwosidGLN-8177-2022en_US
dc.authorscopusid56247021800en_US


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